JPS5886557U - 物体端面傷検出装置 - Google Patents
物体端面傷検出装置Info
- Publication number
- JPS5886557U JPS5886557U JP18332081U JP18332081U JPS5886557U JP S5886557 U JPS5886557 U JP S5886557U JP 18332081 U JP18332081 U JP 18332081U JP 18332081 U JP18332081 U JP 18332081U JP S5886557 U JPS5886557 U JP S5886557U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- camera
- detection device
- stand
- detected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18332081U JPS5886557U (ja) | 1981-12-08 | 1981-12-08 | 物体端面傷検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18332081U JPS5886557U (ja) | 1981-12-08 | 1981-12-08 | 物体端面傷検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5886557U true JPS5886557U (ja) | 1983-06-11 |
JPS6344764Y2 JPS6344764Y2 (en]) | 1988-11-21 |
Family
ID=29982474
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18332081U Granted JPS5886557U (ja) | 1981-12-08 | 1981-12-08 | 物体端面傷検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5886557U (en]) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1990001142A1 (en) * | 1988-07-21 | 1990-02-08 | Kabushiki Kaisha Ksp | Method and apparatus for measuring the surface condition |
JP2013088254A (ja) * | 2011-10-17 | 2013-05-13 | Ihi Corp | 管端検査装置 |
-
1981
- 1981-12-08 JP JP18332081U patent/JPS5886557U/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1990001142A1 (en) * | 1988-07-21 | 1990-02-08 | Kabushiki Kaisha Ksp | Method and apparatus for measuring the surface condition |
JP2013088254A (ja) * | 2011-10-17 | 2013-05-13 | Ihi Corp | 管端検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS6344764Y2 (en]) | 1988-11-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102880860B (zh) | 基于激光扫描的三维指纹采集装置 | |
JPS5886557U (ja) | 物体端面傷検出装置 | |
JP2002542533A5 (en]) | ||
JPH0173855U (en]) | ||
CN210295129U (zh) | 一种台架式耳纹测量仪 | |
CN215072647U (zh) | 一种手持式超宽光谱现场物证搜索摄录仪 | |
JPS6262968U (en]) | ||
CN108387182B (zh) | 一种孔径测量装置以及测量设备 | |
JPS63111070U (en]) | ||
CN116643391A (zh) | 光学超分辨成像装置及成像方法 | |
CN119826695A (zh) | 基于视觉分析的曲轴精度检测装置 | |
CN205280067U (zh) | 一种适用于字符读取设备的移动台 | |
JPS59148126U (ja) | 折曲げ機 | |
CN204178697U (zh) | 一种键盘类乐器琴键的动态图像检测装置 | |
JPS6242372U (en]) | ||
JPS6141479U (ja) | クランプ装置 | |
JPH0343812U (en]) | ||
JPS6142458U (ja) | 超音波探触子の接触媒質収集装置 | |
JPS58160306U (ja) | 光学式形状測定装置 | |
JPH0372305U (en]) | ||
GB2199134A (en) | Rotatable tactile sensor | |
JPH0215731U (en]) | ||
JPS6454252U (en]) | ||
JPH0441651U (en]) | ||
JPS60154807U (ja) | パネル・フアンネルの外径検出装置 |